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Article title ASSESSMENT OF ACCURACY OF MAIN VARIETIES OF REFERENCE VOLTAGE SOURCES IN 0,18 MICRON BICMOS-TECHNOLOGY
Authors B.C. Petrov, E.V. Sukhoterin D.V. Kolesnikov
Section SECTION II. IP-CORES MIXED-SIGNAL SYSTEM ON CHIP
Month, Year 05, 2014 @en
Index UDC 621.3.087.92
DOI
Abstract This article discusses the possibility of obtaining the relative sensitivity of the main varieties of voltage references to schema components using the method of simulation analysis environment sens- CAD Cadence. For "classic" and "proportional" structures identified ION circuit elements that make the greatest contribution to the spread of the reference voltage, calculated standard deviations of the reference voltage mismatch elements and rejection process parameters and sensitivity analysis of the output voltage to the resistors , the base-emitter voltage of the bipolar transistor and the bias voltage of the amplifier. The main advantage of the proposed method in the paper reduce the sensitivity of the output voltage reference to the main elements of the reference voltage source is that compared to traditional engineering solutions "modified " classical architecture has twice the output voltage is less sensitive to the offset voltage of the amplifier, which can significantly improve the quality of characteristics of the reference voltage source.

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Keywords Reference voltage source; relative sensitivity; mismatch circuit elements; deviation of technologic process parameters.
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