Article

Article title USE OF STRUCTURAL INFORMATION IN THE ALGORITHMS OF GENERATION OF IDENTIFYING SEQUENCES
Authors D.E. Ivanov
Section SECTION V. ALGORITHMS AND MODELLING, INFORMATION SAFETY
Month, Year 01, 2013 @en
Index UDC 004.3:681.518
DOI
Abstract The article deals with the effective implementation of structural information about the digital devices in the construction of evaluation functions in the algorithms of generation of identifying sequences. The aim is to construct a mathematical apparatus for the building of evaluation functions. The first objective is the formalization of the parameters of evaluation functions. For this purpose the functions of the achieved component value, component activity and components difference are introduced. The second objective - to show the application of the introduced mathematical formalism in the construction of evaluation functions in practical problems of identification. The formalization of the structural information about the behavior of the device under test allows more accurately assess the sequences, and hence to improve the convergence of evolutionary algorithms.

Download PDF

Keywords Digital device; identification; evolutionary algorithm; evaluation function.
References 1. Goldberg D.E. Genetic Algorithm in Search, Optimization, and Machine Learning. – Boston, MA: Addison-Wesley Longman Publishing Co. – 1989. – 412 p.
2. Скобцов Ю.А. Основы эволюционных вычислений. – Донецк: ДонНТУ, 2008. – 326 с.
3. Иванов Д.Е. Генетические алгоритмы построения входных идентифицирующих последовательностей цифровых устройств.  Донецк, 2012.  240 с.
4. Skobtsov Y.A., Ivanov D.E., Skobtsov V.Y. Genetic algorithms in test generation for digital circuits // Proceedings of the 8th Biennial Baltic Electronics Conference. – Tallinn Technical University, 2002. – P. 291-294.
5. Иванов Д.Е. Применение алгоритмов симуляции отжига в задачах идентификации цифровых схем // Вестник Национального технического университета «Харьковский политехнический институт». Сборник научных трудов. Тематический выпуск: Информатика и моделирование. – Харьков: НТУ "ХПИ", 2011. – № 17. – C. 60-69.
6. Corno F., Prinetto P., Rebaudengo M., Sonza Reorda M. GARDA: a Diagnostic ATPG for Large Synchronous Sequential Circuits // Proc. of IEEE European Design and Test Conference, Paris, March. – 1999. – P. 267-271.
7. Барашко А.С., Скобцов Ю.А., Сперанский Д.В. Моделирование и тестирование дискретных устройств. – Киев: Наукова думка, 1992. – 288 с.
8. Petlin O.A., Furber S.B. Power consumption and testability of CMOS VLSI circuits // IEEE Transactions on CAD. – 2007. – P. 1-6.
9. Luke S. Essentials of Metaheuristics. – George Mason University Press, USA. – 2009. – 239 p.

Comments are closed.